Research Interests:
Application of microtechnology/MEMS for investigating materials properties and performance; mechanical properties of thin films and sub-micrometer structures; interconnect reliability; mechanical and thermomechanical fatigue; scanning probe microscopy including scanning thermal microscopy; electron microscopy; combined technique development (in-situ experimentation);
Professional Affiliations:
Versailles Project on Advanced Materials and Standards (VAMAS)
World Materials Research Institutes Forum (WMRIF)
Rocky Mountain Performance Excellence (RMPEx)
Materials Research Society (MRS)
American Society for Testing and Materials International (ASTM)
Professional Activities:
Organizing Committee, International Microelectronics and Packaging Society (IMAPS) Device Packaging Conference Workshop on MEMS and Associated Microsystems (2008 to 2010)
Awards and Honors:
NIST - National Research Council Postdoctoral Fellowship (2005 to 2007)
United States Department of Commerce Bronze Medal (2008)