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https://www.nist.gov/people/norman-sanford
Norman A. Sanford (Fed)
Direct Research Experience
Atom probe tomography (APT), including extreme ultraviolet APT
Photoconductivity and photoluminescence studies of GaN nanowires
X-ray diffraction studies of thin film GaN and InGaN; X-ray diffraction imaging of GaN and LiNbO3
Linear and nonlinear optical characterization of GaN, AlGaN, LiNbO3, and PPLN
Rare-earth-doped waveguide lasers in silicate glass, phosphate glass, LiNbO3, and LiTaO3
Integrated optical waveguides, modulators, polarization converters, SHG and sum-frequency devices, and photorefractive coupling in LiNbO3
Pump-probe magneto-optic studies of the ferromagnetic semiconductor CrCr2Se4
Professional Associations
Member, Optical Society of America (now Optica)
Associate Editor, IEEE Journal of Quantum Electronics (JQE) (1999-2006)
In collaboration with Guest Editors, co-organized JQE Special Issue on Photonic Crystals (July, 2002)
Guest Topical Editor, JQE Special Section on LiNbO3 optical technology (October, 1997)
Patents
Recent:
Norman A. Sanford, Ann Chiaramonti Debay, Brian P. Gorman, David R. Diercks “Hybrid extreme ultraviolet imaging spectrometer,” U.S. Patent Number 9899197; issued February, 2018
Norman A. Sanford, Ann Chiaramonti Debay, “Imaging spectrometer,” U.S. Patent number 10153144; issued December, 2018
Kristine A. Bertness, Norman A. Sanford, Pavel Kabos, Thomas M. Wallis, “Tip-mounted nanowire light source instrumentation,” U.S. Patent number: 8484756; issued July, 2013
Archive:
Sanford is first author or coauthor of 14 additional U.S. Patents
Awards
H.B. Huntington Award, Rensselaer Polytechnic Institute (1983)
Fellow, Optical Society of America (now Optica) (1996)
U.S. Department of Commerce Bronze Medal (1997) For development and transfer of a non-destructive method to map the uniformity of lithium niobate compatible with integrated optical manufacturing.
R&D Magazine Micro/Nano 25 Award (2006) for Gallium Nitride Nanowire Nanolights
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure
Frances Allen, Paul Blanchard, David Pappas, Russell Lake, Deying Xia, John Notte, Ruopeng Zhang, Andrew Minor, Norman A. Sanford
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for