Dr. Pookpanratana is a member of the research staff within the Advanced Electronics Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML). Dr. Pookpanratana’s current research interests include investigating the electronic properties of wide bandgap semiconductors materials and its defects for advancing power electronics, fusion and hybrid bonding mechanisms used for manufacturing photonic devices and detectors, and on the development and advancement of photoemission electron microscopy (PEEM). Since 2016, Dr. Pookpanratana is a member of the executive committee of the AVS Mid-Atlantic chapter and served as the chair 2020 – 2021.
Prior to 2019, Dr. Pookpanratana’s research activities at NIST included the electronic structure of molecular organic semiconductors and other candidate nanoelectronic systems. With the latter, a complementary measurement approach was applied with electrical characterization, electron and optical spectroscopies. During her graduate studies, she applied both lab- and synchrotron-based x-ray and electron spectroscopies to thin-film III-nitrides, CIGS- and CdTe-based photovoltaics.
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