Sungmin Kim is a Guest Researcher in the Nanoscale Processes and Measurements Group / Joint Quantum Institute (JQI) Associate Research Scientist. He received a B.S. and Ph.D in Physics from Seoul National University, Korea. His doctoral research focused on the epitaxial film growth of the iron-based high Tc superconductors by pulsed laser deposition method, and its measurements by scanning tunneling microscopy and spectroscopy. At NIST Sungmin has been working with Joseph Stroscio, developing the scanning probe microscope (SPM) systems to investigate the physical properties of 2D quantum materials.
As an expert in scanning probe microscopy and cryogenic systems, he has mainly contributed to the construction of a state-of-art multifunctional quantum measurement systems, which combines combining atomic force microscopy (AFM), scanning tunneling microscopy (STM) and electron transport measurement, with the finest energy resolution to date. With this NIST milli-kelvin SPM system, he has been studying the edge states of quantum hall systems, graphene and quantum anomalous Hall (QAHE) systems, using scanning tunneling microscopy and atomic force microscopy.