Tomasz Karpisz

Publications

On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors

July 30, 2024

Author(s)

Tomasz Karpisz, Jacob Pawlik, Johannes Hoffmann, Sarah Evans, Christian Long, Nathan Orloff, James Booth, Angela Stelson

On-wafer calibrations are critical for measurements of embedded devices at the correct reference planes. A major challenge in on-wafer calibrations is the

Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a Glass Wafer Stack from 100 MHz to 30 GHz

July 30, 2024

Author(s)

Jacob Pawlik, Tomasz Karpisz, Nicholas Derimow, Sarah Evans, Jim Booth, Nate Orloff, Chris Long, Angela Stelson

We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With

Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz

August 14, 2023

Author(s)

Florian Bergmann, Meagan Papac, Nick Jungwirth, Bryan Bosworth, Tomasz Karpisz, Anna Osella, Lucas Enright, Eric Marksz, Angela Stelson, Chris Long, Nate Orloff

DyScO3 (DSO) is an attractive substrate on which to grow epitaxial thin films with extraordinary materials physics. However, its highly anisotropic permittivity

Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines

July 28, 2023

Author(s)

Florian Bergmann, Nicholas Jungwirth, Bryan Bosworth, Jason Killgore, Eric Marksz, Tomasz Karpisz, Meagan Papac, Anna Osella, Lucas Enright, Christian Long, Nathan Orloff

Losses in mmWave transmission lines often exceed first-principles predictions based on measurements of dc resistivity and the nominal conductor geometry. In our

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Tomasz Karpisz (IntlAssoc)

Publications