Wilson Ombati Nyangau (IntlAssoc)

Dr. Wilson Ombati Nyang’au is a NIST International Associate and a mass metrology expert from the Kenyan Bureau of Standards (KEBS), where he has worked as a metrologist since 2011. Dr. Nyang’au is currently the head of the Mass Metrology section of the Kenyan Bureau of Standards (KEBS), which is responsible for mass standards, solid density, weighing instruments, and moisture measuring instruments.

Ombati will be working with the Laboratory Metrology program at OWM to develop a multifaceted mass metrology training program that includes in-person classroom and hands-on instructions, access to online and hybrid course modules, and availability to mobile laboratory training components that can be deployed to train metrologists across the Intra-Africa Metrology System (AFRIMETS) and, eventually, the Inter-American Metrology System (SIM) communities. Together with the OWM staff, Ombati will develop and execute a NIST OWM mass proficiency testing and interlaboratory comparison plan with the inclusion of NIST, KEBS, U.S. Regional Measurement Assurance Program (RMAP) laboratories, and other national laboratories within AFRIMETS. Participation in the interlaboratory comparisons will be used to encourage capacity building and knowledge transfer to the individual metrology institutes, supporting metrological traceability, and ensuring the credibility and acceptance of laboratory measurements amongst the participating economies.

As a technical and quality manager for the KEBS Mass Metrology section, he coordinates the drafting and implementation of quality manual/policies, and metrology policies and strategies to safeguard the health and safety of consumers, protect the environment, and inculcate a culture of quality for delivery of organization’s mandate, realization of national long-term development plan (Kenya Vision 2030), African Union Agenda 2063 and United Nations Sustainable Development Goals. He also manages research activities and implementation of a sectional measurement framework based on the international measurement best practices for innovation and product development to reduce technical barriers to trade and enhance the competitiveness of local products and services. Moreover, to ensure international recognition of measurement results, he oversees the maintenance of metrological traceability of the national measurements to the International System of Unit (SI). He is also responsible for developing, submitting, and maintaining Calibration and Measurement Capabilities (CMCs) and reviewing comparison results and CMCs for mass and density measurements in the BIPM Key Comparison Database.

To promote measurements and facilitate regional and international trade, Ombati is also responsible for establishing and maintaining linkages and partnerships with other National, Regional (AFRIMETS, APMP), and international organizations in mass metrology. He also coordinates the identification and requisition of equipment and infrastructure needs in Mass Metrology and develops and leads in the implementation of business continuity strategies to ensure the resilience and sustainability of the section’s processes, products, and services.

During his tenure at KEBS, he was involved in developing and establishing training programs on various metrology training programs such as foundational calibration course, basic mass metrology, calibration course on non-automatic weighing instruments (based on OIML R76 and EURAMET cg 18), and grain moisture instruments calibration. Moreover, he also serves as a technical assessor for the national accreditation body (Kenya Accreditation Services) in the field of mass and related quantities. Since July 2024, Ombati has also held the position of Vice Chair of the AFRIMETS Technical Committee for Mass and related quantities. Please see the following Orcid and Google Scholar links for a list of publications for Ombati Wilson Nyang’au.

PROFESSIONAL AFFILIATIONS

• Physics Society of Kenya – Member (2012 – to date); Secretary (2024 to date)
• International Graduate School of Metrology, B-IGSM – Member/PI (2021 – to date)