Yvonne Gerbig

Research Interests

Development and application of methods and traceable techniques for quantitative measurements of mechanical properties at the micro and nanoscale
Development and application of indentation instruments with in-situ capabilities of optical and Raman microscopy
Development and application of piezospectroscopic measurements methods for nanoscale strain distribution in materials

Orcid: 0000-0002-8947-4215 (https://orcid.org/0000-0002-8947-4215)

Awards

2013 MSEL Distinguished Associate Award

Selected Publications

In-situ Raman spectroscopic measurements of the deformation region in indented glasses

February 15, 2020

Author(s)

Yvonne B. Gerbig, Chris A. Michaels

This paper describes the design and integration of a custom-built optical instrument for in- situ Raman microscopy suitable for collecting high-quality

In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions

December 17, 2015

Author(s)

Yvonne B. Gerbig, Chris A. Michaels, Robert F. Cook, Jodie E. Bradby

Indentation-induced plastic deformation of amorphous silicon (a-Si) thin films was studied by in situ Raman imaging of the deformed contact region of an

In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films

April 19, 2016

Author(s)

Yvonne B. Gerbig, Chris A. Michaels, Robert F. Cook

The pressure induced phase transitions of crystalline Si films was studied in situ under a Berkovich probe using the Raman spectroscopy-enhanced instrumented

Indentation device for in situ Raman spectroscopic and optical studies

December 12, 2012

Author(s)

Yvonne B. Gerbig, Chris A. Michaels, Aaron M. Forster, John W. Hettenhouser, Walter E. Byrd, Dylan J. Morris, Robert F. Cook

Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in

Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy

November 27, 2017

Author(s)

Andrew J. Gayle, Lawrence Henry Friedman, Ryan Beams, Brian G. Bush, Yvonne B. Gerbig, Chris A. Michaels, Mark D. Vaudin, Robert F. Cook

The strain field surrounding a spherical indentation in silicon is mapped in two dimensions (2- D) using electron backscatter diffraction (EBSD) cross

Publications

Raman spectroscopic measurements and imaging on sub-newton Berkovich and spherical imprints in fused silica

January 6, 2024

Author(s)

Yvonne Gerbig, Chris A. Michaels

This paper lays out a general approach for evaluating and optimizing a Raman spectroscopy setup to ensure the collection of reliable spectral data and/or Raman

In-situ Raman spectroscopic measurements of the deformation region in indented glasses

February 15, 2020

Author(s)

Yvonne B. Gerbig, Chris A. Michaels

This paper describes the design and integration of a custom-built optical instrument for in- situ Raman microscopy suitable for collecting high-quality

Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy

November 27, 2017

Author(s)

Andrew J. Gayle, Lawrence Henry Friedman, Ryan Beams, Brian G. Bush, Yvonne B. Gerbig, Chris A. Michaels, Mark D. Vaudin, Robert F. Cook

The strain field surrounding a spherical indentation in silicon is mapped in two dimensions (2- D) using electron backscatter diffraction (EBSD) cross

In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films

April 19, 2016

Author(s)

Yvonne B. Gerbig, Chris A. Michaels, Robert F. Cook

The pressure induced phase transitions of crystalline Si films was studied in situ under a Berkovich probe using the Raman spectroscopy-enhanced instrumented

Assessing Electron Backscattered Diffraction and Confocal Raman Microscopy Strain Mapping Using Wedge-indented Si

February 17, 2016

Author(s)

Lawrence Henry Friedman, Mark D. Vaudin, Stephan J. Stranick, Gheorghe Stan, Yvonne B. Gerbig, William Alexander Osborn, Robert F. Cook

The accuracy of electron backscattered diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial

View more Publications

Yvonne Gerbig (Fed)

Mechanical Engineer

Awards

Selected Publications

In-situ Raman spectroscopic measurements of the deformation region in indented glasses

In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions

In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films

Indentation device for in situ Raman spectroscopic and optical studies

Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy

Publications

Raman spectroscopic measurements and imaging on sub-newton Berkovich and spherical imprints in fused silica

In-situ Raman spectroscopic measurements of the deformation region in indented glasses

Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy

In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films

Assessing Electron Backscattered Diffraction and Confocal Raman Microscopy Strain Mapping Using Wedge-indented Si