Jarrett, D.
and Kraft, M.
(2013),
10 TOhm and 100 TOhm High Resistance Measurements at NIST, 10th International Seminar on Electrical Metrology (X Semetro), Buenos Aires, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913673
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
10 TOhm and 100 TOhm High Resistance Measurements at NIST
Published
Author(s)
,
Abstract
The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple paths from 1 TΩ to the higher levels of resistance. Settling times, voltage coefficients, drift rates, and temperature coefficients of the resistance standards were determine to evaluate the extension of high resistance measurements at NIST beyond the 1 TΩ level of resistance.Proceedings Title
10th International Seminar on Electrical Metrology (X Semetro)
Conference Dates
September 25-27, 2013
Conference Location
Buenos Aires
Pub Type
Conferences
Download Paper
Keywords
standard resistor, guarded Hamon transfer standard, settling time, scaling, measurements
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 25, 2013, Updated February 19, 2017