Ryan, J.
, Southwick, R.
, Campbell, J.
, Cheung, K.
and Young, C.
(2011),
On the “U-Shaped” Continuum of Band Edge States at the Si/SiO2 Interface, Applied Physics Letters
(Accessed March 13, 2025)
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On the U-Shaped Continuum of Band Edge States at the Si/SiO2 Interface
Published
Author(s)
, , , , Chadwin Young
Citation
Applied Physics Letters
Volume
99
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 2011, Updated February 19, 2017