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Analytic Sampling-Circuit Model

Published

Author(s)

Dylan F. Williams, Catherine A. Remley

Abstract

Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction capacitance and conductance on the impulse response and kickout pulses, and discuss their impact on the accuracy of the nose-to-nose calibration technique.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
49
Issue
6

Citation

Williams, D. and Remley, C. (2001), Analytic Sampling-Circuit Model, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/22.925484 (Accessed June 30, 2024)

Issues

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Created June 1, 2001, Updated January 27, 2020