Holm, J.
and Keller, B.
(2015),
Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector, Microscopy & Microanalysis 2015 Meeting, Portland, OR, US, [online], https://doi.org/10.1017/S1431927615010119, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918051
(Accessed January 13, 2025)
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Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector
Published
Author(s)
Jason Holm,
Abstract
This work demonstrates how a modular transmission detector can be used to extend the analytical capabilities of a conventional SEM. By implementing a new sample holder and aperture system, we show that high angle and other dark field imaging techniques are compatible with one particular modular transmission detector, thereby enabling atomic number contrast.Proceedings Title
Microscopy & Microanalysis 2015 Meeting
Volume
21 (Suppl 3)
Conference Dates
August 2-6, 2015
Conference Location
Portland, OR, US
Pub Type
Conferences
Download Paper
Keywords
transmission, t-SEM, STEM
Citation
Issues
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Created August 6, 2015, Updated April 19, 2022