Phillips, W.
(1996),
A Beam Line for Highly Charged Ions Extracted from the NIST EBIT, Review of Scientific Instruments
(Accessed October 31, 2024)
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A Beam Line for Highly Charged Ions Extracted from the NIST EBIT
Published
Author(s)
Citation
Review of Scientific Instruments
Volume
67
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1996, Updated February 17, 2017