Orloff, N.
, Mateu, J.
, Murakami, M.
, Takeuchi, I.
and Booth, J.
(2007),
Broadband Characterization of Multilayer Dielectric Thin-Films, Microwave Symposium, 2007. IEEE/MTT-S International, Honolulu, HI, [online], https://doi.org/10.1109/MWSYM.2007.380340
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Broadband Characterization of Multilayer Dielectric Thin-Films
Published
Author(s)
, Jordi Mateu, Makoto Murakami, Ichiro Takeuchi,
Abstract
We develop a measurement technique for obtaining the broadband complex permittivity of thin-film dielectric materials over the frequency range from 100 Hz-40 GHz. Such broad frequency coverage can only be accomplishe3d by combining lumped-element and distributed devices, and is implemented int his technique using planar capacitors and transmission lines. We experimentally determine the capacitance and conductance per unit lenght for these different structures fabricated ont he same thin-film samples, and extract consisent values for the relative permittivity throught the use of detailed finite-element simulations. We demonstrate the utility of this technique by applying it to study the frequency dependence of the dielectric response of ferroelectric, ferromagnetic, and multiferroic thin film samples.Conference Dates
June 3-8, 2007
Conference Location
Honolulu, HI
Conference Title
Microwave Symposium, 2007. IEEE/MTT-S International
Pub Type
Conferences
Download Paper
Keywords
broadband, multiferroic, PbTiO3, thin-films
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 3, 2007, Updated January 27, 2020