U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Calibrated Broadband Electrical Characterization of Nanowires

Published

Author(s)

Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos

Abstract

A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as a direct measurement of the capacitive coupling that is in parallel with the nanowire admittance. GaN nanowire devices are used to demonstrate the measurement technique and their response is found to depend strongly on quality of electrical contacts and the geometry of the nanowire network.
Proceedings Title
Conference on Precision Electromagnetic Measurements
Conference Dates
June 8-12, 2008
Conference Location
Broomfield, CO, USA
Conference Title
CPEM 2008
Pub Type
Conferences

Keywords

calibration, semiconductor nanowires, microwaves, radio frequency nanoelectronics, on-wafer measurements
Electromagnetics

Citation

Wallis, T. , Imtiaz, A. , Nembach, H. , Bertness, K. , Sanford, N. , Blanchard, P. and Kabos, P. (2008), Calibrated Broadband Electrical Characterization of Nanowires, Conference on Precision Electromagnetic Measurements, Broomfield, CO, USA (Accessed January 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 7, 2008, Updated October 12, 2021