Chapter 7. Probe-based measurement systems

Published

September 17, 2017

Author(s)

Thomas M. Wallis, Pavel Kabos

Abstract

In the preceding chapters, we have focused on broadband, calibrated measurements of nanoelectronic devices. In particular, we have described measurement techniques for the measurement of calibrated, complex scattering parameters and the subsequent extraction of circuit model parameters. In order to facilitate the ongoing development of novel, radio-frequency (RF) nanoelectronic devices, it is highly desirable to complement scattering parameter measurements with local, intra-device measurements. Furthermore, non-destructive, spatially-localized characterization of nanomaterials and other nanoelectronic building blocks is critical for engineering of RF nanoelectronics. Thus, in this chapter, we introduce broadband, near-field probes, especially those integrated with scanning probe microscopes. A critical component of the near-field scanning microwave microscope is the broadband probe and the probe’s near field interaction with investigated materials and devices. Therefore, we will place particular emphasis on near-field probes that are similar to atomic force microscope cantilevers, including models for local effects around the tip-apex, as well as the parasitic effects of the cantilever’s body. This introduction should serve as a foundation for understanding the application of these measurement systems to semi-quantitative and quantitative characterization of both devices and materials. We will discuss the fundamental concepts and modeling of probe-based measurement systems. In addition, we shall introduce techniques for calibration of broadband scanning probe systems that enable quantitative characterization of device and material properties.

Citation

Measurement Techniques for Radio Frequency Nanoelectronics

Publisher Info

Cambridge University Press, Cambridge, -1

Pub Type

Books

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Keywords

near-field scanning microwave microscopy, nanoelectromagnetics, near-field interactions, microwave meterology, nanoelectronics

Citation

Wallis, T. and Kabos, P. (2017), Chapter 7. Probe-based measurement systems, Cambridge University Press, Cambridge, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922140 (Accessed December 27, 2024)