Kaplan, S.
and Hanssen, L.
(1998),
Characterization of Narrow-Band Infrared Interference Filters, SPIE series
(Accessed November 8, 2024)
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Characterization of Narrow-Band Infrared Interference Filters
Published
Author(s)
,
Abstract
A Fourier-transform infrared (FT-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an f/4 beam geometry at normal incidence, or a nearly collimated geometry with variable angle of incidence. Blocking filters are used to expand the dynamic range of the out-of-band measurement to transmittances as low as 10-6 with 4 cm-1 resolution.Citation
SPIE series
Pub Type
Journals
Keywords
filter, infrared, transmittance
Citation
Issues
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Created October 8, 1998, Updated June 27, 2017