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On-chip Silicon Photonics Radiation Sensors

Published

Author(s)

Nikolai N. Klimov, Zeeshan Ahmed, Lonnie T. Cumberland, Ileana M. Pazos, Ronald E. Tosh, Ryan P. Fitzgerald

Abstract

We have examined the impact of cobalt-60-ray radiation up to 1 megagray (MGy) absorbed dose on silicon photonic devices. We do not find any systematic impact of radiation on passivated devices, indicating the durability of passivated silicon devices under harsh conditions.
Proceedings Title
Frontiers in Optics 2019
Conference Dates
May 5-10, 2019
Conference Location
Washington, DC
Conference Title
Silicon Nanophotonics Platform for Radiation Dosimetry

Keywords

nanophotonics, thermometry, raidation, hardness, e-grey

Citation

Klimov, N. , Ahmed, Z. , Cumberland, L. , Pazos, I. , Tosh, R. and Fitzgerald, R. (2019), On-chip Silicon Photonics Radiation Sensors, Frontiers in Optics 2019, Washington, DC (Accessed December 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 18, 2019, Updated January 27, 2020