Eppeldauer, G.
(1998),
Chopped Radiation Measurements With Large Area Si Photodiodes, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 31, 2024)
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Chopped Radiation Measurements With Large Area Si Photodiodes
Published
Author(s)
Citation
Journal of Research (NIST JRES) -
Volume
103 No. 2
NIST Pub Series
Pub Type
NIST Pubs
Keywords
Bode plot, chopped light, frequency dependence, measurement, optical radiation, photocurrent, photodiode, radiometer, reponsivity, silicon
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 1, 1998, Updated February 17, 2017