Williams, D.
and Marks, R.
(1994),
Compensation for Substrate Permittivity in Probe-Tip Calibration, Tech Dig., Auto. RF Tech. Group Conf., Boulder, CO, [online], https://doi.org/10.1109/ARFTG.1994.327077
(Accessed December 16, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Compensation for Substrate Permittivity in Probe-Tip Calibration
Published
Author(s)
,
Abstract
We demonstrate a method of compensation for the effect of substrate permittivity on coplanar waveguide probe-tip scattering parameter calibrations, modeling the effect as a capacitance at the probe tip. Comparison to on-wafer multiline TRL calibration verifies its accuracy. The method allows calibration to the probe tip using generic off-wafer standards with accuracy comparable to that of on-wafer calibration.Proceedings Title
Tech Dig., Auto. RF Tech. Group Conf.
Volume
26
Conference Dates
December 1-2, 1994
Conference Location
Boulder, CO
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1994, Updated November 10, 2018