Correction for Nonlinear Vector Network Analyzer Measurements Using a Stochastic Multiline/Reflect Method

Published

June 11, 2004

Author(s)

Donald C. DeGroot, Yves Rolain, Rik Pintelon, Johan Schoukens

Abstract

A new 16-term statistical calibration is developed for the correction of vector network analyzer (VNA) data. The method uses multiple measurments of gneric transmission line and reflection standards. Using a functional model of the system and transmission line standards, we apply a nonlinear least-square estimator to simultaneously optimize the correction terms in the measurement model and the propagation constant. The method provides estimates of the uncertainty on each of the parameters using the final Jacobian. This paper shows for the first time an application of the new calibration to a commercial nonlinear VNA, plus quantitative statements regardint eh quality of the parameters.

Proceedings Title

IEEE-MTT-S International Microwave Symposium Digest

Conference Dates

June 6-11, 2004

Conference Location

Fort Worth, TX, USA

Conference Title

IEEE MTT-S International Microwave Symposium

Pub Type

Conferences

Keywords

Calibrations, measurements, propagation constant., vector network analyzer

Citation

DeGroot, D. , Rolain, Y. , Pintelon, R. and Schoukens, J. (2004), Correction for Nonlinear Vector Network Analyzer Measurements Using a Stochastic Multiline/Reflect Method, IEEE-MTT-S International Microwave Symposium Digest, Fort Worth, TX, USA (Accessed January 3, 2025)