U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Correlation of Structure and Morphology in an Ethylene-glycol Side-chain Modified Polythiophene via Combined X-ray Scattering and Four-dimensional Scanning Transmission Electron Microscopy

Published

Author(s)

Andrew Herzing, Lucas Flagg, Chad R. Snyder, Lee Richter, Jonathan Onorato, Christine Luscombe, Ruipeng Li

Abstract

We report the results of a combined grazing incidence wide-angle X-ray scattering (GIWAXS) and four-dimensional scanning transmission microscopy (4D-STEM) analysis of the effects of thermal processing on poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene- 2,5-diyl), a conjugated semiconducting polymer used as the active layer in organic electrochemical transistor devices. GIWAXS provides a measure of overall crystallinity in the film, while 4D-STEM produces real-space maps of the morphology and orientation of individual crystallites along with their spatial extent and distribution. The sensitivity of the 4D-STEM detector allows for collection of electron diffraction patterns at each position in an image scan while limiting the imparted electron dose to below the damage threshold. The effects of heat treatment on the distribution and type of crystallites present in the films is determined.
Citation
Small Methods
Volume
9
Pub Type
Journals

Download Paper

https://doi.org/10.1002/smtd.202400801
Local Download

Keywords

OECT, 4D-STEM, STEM, nanocharacterization
Semiconductors, Polymers, Organic electronics and Materials characterization

Citation

Herzing, A. , Flagg, L. , Snyder, C. , Richter, L. , Onorato, J. , Luscombe, C. and Li, R. (2024), Correlation of Structure and Morphology in an Ethylene-glycol Side-chain Modified Polythiophene via Combined X-ray Scattering and Four-dimensional Scanning Transmission Electron Microscopy, Small Methods, [online], https://doi.org/10.1002/smtd.202400801, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956264 (Accessed April 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 10, 2024, Updated April 1, 2025