Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III

Published

April 1, 2001

Author(s)

Uwe Arp

Abstract

Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the Synchrotron Ultraviolet Radiation Facility (SURF) III at the National Institute of Standards and Technology (NIST) were studied over an extended period of time to characterize the upgraded accelerator. There is good agreement between experimental and theoretical horizontal beam sizes at three different electron energies.

Citation

Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment

Volume

462

Issue

No. 3

Pub Type

Journals

Keywords

depth of field, diffraction, electron beam diagnostics, storage ring, synchrotron radiation, tranverse beam size

Citation

Arp, U. (2001), Diffraction and Depths-of-Field Effects in Electron Beam Imaging at SURF III, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment (Accessed October 15, 2025)