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PUBLICATIONS

Dimensional measurement traceability of 3D imaging data

Published

Author(s)

Steven D. Phillips, Craig M. Shakarji, Michael Krystek, K Summerhays

Abstract

This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to the traceability of 3D imaging data.
Proceedings Title
Proceedings of SPIE Volume 7239
Volume
7239
Conference Dates
January 19-20, 2009
Conference Location
San Jose, CA
Conference Title
3D Imaging Metrology
Pub Type
Conferences

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Keywords

traceability, calibration, dimensional metrology, simulation, laser scanning, laser tracker
Manufacturing, Metrology and Dimensional metrology

Citation

Phillips, S. , Shakarji, C. , Krystek, M. and Summerhays, K. (2009), Dimensional measurement traceability of 3D imaging data, Proceedings of SPIE Volume 7239, San Jose, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=900252 (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 19, 2009, Updated February 19, 2017