Shaw, J.
, Geiss, R.
and Russek, S.
(2006),
Dynamic Lorentz Microscopy of Micromagnetic Structure in Magnetic Tunnel Junctions, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32349
(Accessed November 21, 2024)
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Dynamic Lorentz Microscopy of Micromagnetic Structure in Magnetic Tunnel Junctions
Published
Author(s)
, R.H. Geiss,
Abstract
Lorentz microscopy was used to study the micromagnetic structure and magnetization reversal in magnetic tunnel junctions (MTJs) fabricated with different processing conditions including a preoxidation process. The authors find that the free layer in a MTJ has considerably more disorder than that seen in an isolated magnetic layer. The disorder changes with anneals that set the exchange bias, suggesting that the disorder arises from the antiferromagnetic layer and is transferred to the free layer by magnetostatic Neel coupling. The disorder and time-dependent fluctuations in the magnetic structure provide a foundation for understanding several sources of 1/fI/} noise in MTJs.Citation
Applied Physics Letters
Volume
89
Pub Type
Journals
Download Paper
Keywords
Lorentz microscopy, magnetic tunnel junction, magnetization reversal, micromagnetic, mtj, Neel, ripple
Citation
Issues
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Created November 19, 2006, Updated October 12, 2021