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Efficiency of quasiparticle evacuation in superconducting devices
Published
Author(s)
Sukumar Rajauria, L. Pascal, P. Gandit, F. Hekking, B. Pannetier, H. Courtois
Abstract
We have studied the di®usion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes signi¯cantly to the evacuation of excess quasiparticles.
Rajauria, S.
, Pascal, L.
, Gandit, P.
, Hekking, F.
, Pannetier, B.
and Courtois, H.
(2012),
Efficiency of quasiparticle evacuation in superconducting devices, Physical Review B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908584
(Accessed October 12, 2025)