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Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules

Published

Author(s)

Allen R. Hefner Jr.

Citation

Hefner, A. (2009), Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules (Accessed July 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 28, 2009, Updated February 19, 2017