Hale, P.
and Williams, D.
(2010),
Electro-optic sampling for traceable high-speed electrical measurements, IEEE MTT 2010 International Microwave Symposium, Anaheim, CA
(Accessed July 1, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Electro-optic sampling for traceable high-speed electrical measurements
Published
Author(s)
,
Abstract
We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the time and frequency domains. Once calibrated, the photodiode can be used as a known source, providing traceability to both time- and frequency-domain based equipment, including oscilloscopes, vector signal generators, vector signal analyzers, and large signal network analyzers.Proceedings Title
IEEE MTT 2010 International Microwave Symposium
Conference Dates
May 23-28, 2010
Conference Location
Anaheim, CA
Conference Title
IEEE MTT 2010 International Microwave Symposium
Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"
Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"
Pub Type
Conferences
Keywords
Electro-optic sampling, oscilloscope, photodiode
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 23, 2010, Updated February 19, 2017