Bendersky, L.
and Gayle, F.
(2001),
Electron Diffraction Using Transmission Electron Microscopy, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 31, 2024)
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Electron Diffraction Using Transmission Electron Microscopy
Published
Author(s)
,
Abstract
Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (~2 pm), the strong atomic scattering, even from light elements, and the ability to examine tiny volumes of matter (~ 10 nm(Superscript 3)). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper provides a survey of some of this work enabled through electron microscopy.Citation
Journal of Research (NIST JRES) -
Volume
106 No. 6
NIST Pub Series
Pub Type
NIST Pubs
Keywords
crystal structure, crystallography, defects, electron diffraction, phase transitions, quasicrystals, transmission electron microscopy
Citation
Issues
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Created November 1, 2001, Updated February 17, 2017