Wight, S.
, Gillen, G.
and Herne, T.
(1997),
Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS, Microscopy and Microanalysis, xxxx, -1
(Accessed December 22, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Published
Author(s)
, G Gillen,
Proceedings Title
Microscopy and Microanalysis
Conference Dates
February 13, 2009
Conference Location
xxxx
Conference Title
Microscopy and Microanalysis Proceedings
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1997, Updated February 19, 2017