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PUBLICATIONS

Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework

Published

Author(s)

Jeffrey A. Jargon, Dylan F. Williams, Thomas M. Wallis, Denis X. LeGolvan, Paul D. Hale

Abstract

We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized, we use it to calibrate a network analyzer, and characterize a number of verification devices with corresponding uncertainties. We also calibrate the same verification devices using one of the previous multiline TRL calibrations, and compare results.
Proceedings Title
ARFTG 79th Microwave Measurement Conference
Conference Dates
June 22, 2012
Conference Location
Montreal
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG79.2012.6291181

Keywords

electronic calibration unit, traceability, uncertainty, vector network analyzer
Metrology

Citation

Jargon, J. , Williams, D. , Wallis, T. , LeGolvan, D. and Hale, P. (2012), Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework, ARFTG 79th Microwave Measurement Conference, Montreal, -1, [online], https://doi.org/10.1109/ARFTG79.2012.6291181 (Accessed December 15, 2024)

Issues

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Created June 22, 2012, Updated November 10, 2018