Taylor, M.
, Chapman, W.
, Hicklin, A.
, Kiebuzinski, G.
, Mayer-Splain, J.
, Wallner, R.
and Komarinski, P.
(2013),
Extended Feature Set Profile Specification, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.1134
(Accessed November 23, 2024)
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Extended Feature Set Profile Specification
Published
Author(s)
, Will Chapman, Austin Hicklin, George Kiebuzinski, John Mayer-Splain, Rachel Wallner, Peter Komarinski
Abstract
This specification defines Extended Feature Set (EFS) Profiles - sets of features to be used in latent friction ridge (fingerprint, palmprint or plantar) searches of automated friction ridge identification systems (AFIS). The EFS Profiles are designed to be interoperable among AFIS systems from different vendors and to enable cross-jurisdictional searches that would not otherwise be practical. Multiple EFS Profiles are defined to allow for tradeoffs between examiner time and search accuracy. EFS Profiles also may be used simply to document latent friction ridge features, such as for potential use in legal proceedings or exchange between latent examiners, and need not be for AFIS matching purposes.Citation
Special Publication (NIST SP) - 1134
Report Number
1134
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
AFIS, fingerprint, forensic science, interoperability, latent print, palmprint, forensics
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 13, 2013, Updated November 10, 2018