Yang, J.
, Grother, P.
, Ngan, M.
, Hanaoka, K.
and Hom, A.
(2023),
Face Analysis Technology Evaluation (FATE) Part 11: Face Image Quality Vector Assessment: Specific Image Defect Detection, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8485, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956188
(Accessed November 20, 2024)
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Face Analysis Technology Evaluation (FATE) Part 11: Face Image Quality Vector Assessment: Specific Image Defect Detection
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NIST Interagency/Internal Report (NISTIR) - 8485
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8485
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Created September 19, 2023