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Femtotesla atomic magnetometry in a microfabricated vapor cell

Published

Author(s)

William C. Griffith, Svenja A. Knappe, John Kitching

Abstract

We describe an optically pumped 87Rb magnetometer with 4.5 fT/Hz1/2 sensitivity when operated in the spin-exchange relaxation free (SERF) regime. The magnetometer uses a microfabricated vapor cell, consisting of a cavity etched in a 1 mm thick silicon wafer with anodically bonded pyrex windows. The measurement volume of the magnetometer is 1 mm3, defined by the overlap region of a circularly polarized pump laser, and a linearly polarized probe laser, both operated near 795 nm. Sensitivity limitations unique to the use of microfabricated cells are discussed.
Citation
Optics Express
Volume
18

Keywords

atomic magnetometer, CSAM, microfabricated magnetometer

Citation

Griffith, W. , Knappe, S. and Kitching, J. (2010), Femtotesla atomic magnetometry in a microfabricated vapor cell, Optics Express, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906531 (Accessed November 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 19, 2010, Updated October 12, 2021