Semerjian, H.
(1997),
A Global View of Chemical Metrology: Recent Developments and Basic Concepts, Proceedings of the 1st Interamerican Workshop on Metrology in Chemistry, Rio de Janeiro,
(Accessed April 20, 2025)
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A Global View of Chemical Metrology: Recent Developments and Basic Concepts
Published
Author(s)
Proceedings Title
Proceedings of the 1st Interamerican Workshop on Metrology in Chemistry
Conference Dates
January 1, 0001
Conference Location
Rio de Janeiro,
Conference Title
1st Interamerican Workshop on Metrology in Chemistry
Pub Type
Conferences
Citation
Issues
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Created December 16, 1997, Updated February 19, 2017