Yi, H.
, Liu, P.
, Fleisher, A.
and Hodges, J.
(2017),
High-accuracy <sup>12</sup>C<sup>16</sup>O<sub>2</sub> line intensities in the 2 micron wavelength region measured by frequency-stabilized cavity ring-down spectroscopy, Journal of Quantitative Spectroscopy and Radiative Transfer, [online], https://doi.org/10.1016/j.jqsrt.2017.12.008, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922644
(Accessed December 26, 2024)