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Integration of a Mobile Terahertz Spectroscopic System based on HEB Heterodyne Detection

Published

Author(s)

Jack T. Surek, Eyal Gerecht, Thomas J. Hofer

Abstract

We are developing a mobile heterodyne terahertz system based on hot electron bolometer (HEB) mixer receivers to both image and obtain spectroscopic signatures from 2-D samples. An HEB provides unprecedented sensitivity and spectral resolution at terahertz frequencies when used in this way. We have recently demonstrated a low-noise heterodyne imager operating at 0.85 THz. A heterodyned HEB detector integrated with a MMIC LNA and quasi-optical beam handling based on HDPE lenses are central tthis radiometric system. The current design is optimized for the 600 GHz and 800 GHz atmospheric windows, but can be extended to any terahertz frequency. A state-of-the-art mechanical cooler with a very small footprint, high temperture stability, and low mechanical vibrations has been developed for our HEB receiver technology. We intend to perform fast broadband terahertz spectroscopy within the spot size of this mobile platform at locations identified first through imaging at a fixed terahertz frequency. For spectroscopy we will chirp the heterodyne LO from 600 to 850 gigahertz. Our goal is to design a robust system that can be used to identify abnormal molecular states at the sample surface in life science and materials applications.
Conference Dates
April 20-22, 2009
Conference Location
Charlottesville, VA
Conference Title
20th International Symposium on Space Terahertz Technology

Keywords

Heterodyne detection, hot electron bolometer (HEB) detectors, quasi-optical coupling, radiometry, terahertz imaging, terahertz spectroscopy

Citation

Surek, J. , Gerecht, E. and J., T. (2009), Integration of a Mobile Terahertz Spectroscopic System based on HEB Heterodyne Detection, 20th International Symposium on Space Terahertz Technology, Charlottesville, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902395 (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 20, 2009, Updated February 19, 2017