Goodrich, L.
and Bray, S.
(1989),
Integrity Tests for High-Tc and conventional critical-current measurement systems, Advances in Cryogenic Engineering, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905536
(Accessed November 21, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Integrity Tests for High-Tc and conventional critical-current measurement systems
Published
Author(s)
, S L. Bray
Abstract
Critical-current measurement systems must be extremely sensitive to the small differential voltage that is present across the test specimen as it changes from zero resistance state to the flux-flow resistance state. Consequently, these measurement systems are also sensitive to interfering voltages. Such voltages can be caused by ground loops and by common mode voltages. Specific methods for testing the sensitivity of critical-current measurement systems and for detecting the presence of interfering voltages are discussed. These include a simple procedure that simulates the zero resistance state and the use of an electronic circuit that simulates the flux-flow resistance state.Citation
Advances in Cryogenic Engineering
Volume
36A
Pub Type
Journals
Download Paper
Keywords
integrity tests, measurement, systems
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 28, 1989, Updated February 19, 2017