Dvornychenko, V.
(2008),
Latent Fingerprint Performance Modeling, IS&T/SPIE 20th Annual Symposium: Electronic Imaging, Science & Technology, San Jose, CA
(Accessed November 8, 2024)
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Latent Fingerprint Performance Modeling
Published
Author(s)
Abstract
This paper describes aspects of work done at NIST, in concert with the latent fingerprint community, toward achieving a partial lights-out latent fingerprint processing capability. The initial steps are to quantify performance over a cross-section of latent fingerprint matchers using representative latent fingerprints. This will give a clearer picture of the state of the art, and where the weaknesses lie. Analytic tools for modeling latent system performance are presented. Covered are: the selection of test dataset size (both search and background); methods of projecting to a ¿fully populated¿ system; and modeling errors. It is shown that when modeling errors are taken into account ¿bigger is better¿ may not always apply to dataset size.Proceedings Title
IS&T/SPIE 20th Annual Symposium: Electronic Imaging, Science & Technology
Conference Dates
January 28-31, 2008
Conference Location
San Jose, CA
Conference Title
SPIE Electronic Imaging Conference
Pub Type
Conferences
Keywords
Latent fingerprints, automated fingerprint searches, lights-out, performance modeling
Citation
Issues
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Created January 14, 2008, Updated February 19, 2017