Swyt, D.
(2001),
Length and Dimensional Measurements at NIST, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Length and Dimensional Measurements at NIST
Published
Author(s)
Abstract
This paper reports on the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen orders of magnitude. Uncertainties of measurements on different types of materials artifacts range down to 7 x 10-8 at 1 meter and 8 picometers at 300 pm. Current work deals with a broad-range of areas of dimensional metrology. These including: large-scale coordinate systems; complex form; microform; surface finish; two-dimensional grids; optical, scanning-electron, atomic-force, and scanning-tunneling microscopies; atomic-scale displacement; and atom-based artifacts.Citation
Journal of Research (NIST JRES) -
Volume
106 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
atomic-force, dimensional, interferometry, length, measurements, microscopes, optical, scanning-electron, traceability
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 1, 2001, Updated February 19, 2017