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Leveraging Combinatorial Coverage in the Machine Learning Product Lifecycle

Published

Author(s)

Jaganmohan Chandrasekaran, erin lanus, tyler cody, laura freeman, Raghu N. Kacker, M S Raunak, D. Richard Kuhn

Abstract

The data-intensive nature of machine learning (ML)-enabled systems introduces unique challenges in test and evaluation. We present an overview of combinatorial coverage, exploring its applications across the ML-enabled system lifecycle and its potential to address key limitations in performing test and evaluation for ML-enabled systems.
Citation
Computer (IEEE Computer)
Volume
57
Issue
7

Keywords

Machine Learning, Combinatorial Coverage, Combinatorial Testing, Test generation, Model Maintenance, Regression Testing

Citation

Chandrasekaran, J. , Lanus, E. , cody, T. , Freeman, L. , Kacker, R. , Raunak, M. and Kuhn, D. (2024), Leveraging Combinatorial Coverage in the Machine Learning Product Lifecycle, Computer (IEEE Computer), [online], https://doi.org/10.1109/MC.2024.3366142, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936815 (Accessed July 18, 2024)

Issues

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Created June 27, 2024, Updated July 17, 2024