Mapping Polymeric Properties Using Combinatorial and High-Throughput Methods: Adhesion and Mechanical Properties

Published

May 1, 2004

Author(s)

Aaron M. Forster, A Chiche, Martin Chiang, Christopher Stafford, Alamgir Karim

Abstract

High-throughput and combinatorial methods unlock novel approaches to investigations of new materials, allowing the materials community to carry out studies that promise greater efficiency to materials discovery and optimization. To this end, we have developed a suite of test methods to probe the adhesive and mechanical properties of polymer coatings and interfaces. This presentation will describe the efforts of the NIST Combinatorial Methods Center to develop a multi-lens adhesion test, combinatorial peel test, combinatorial edge delamination test, and a thin film modulus measurement.

Proceedings Title

Society of Plastics Engineers, Annual Technical Conference| 62nd Volume II | ANTEC 2004: Annual Technical Conference Proceedings | Society of Plastics Engineers

Volume

301(2)

Conference Dates

May 15-16, 2004

Conference Location

Undefined

Conference Title

ANTEC (Society of Plastics Engineers. Technical Conference)

Pub Type

Conferences

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Keywords

adhesion, edge delamination, JKR, m-ELF, mechanical measurement, modulus, peel test, PSA, SIEBIMM

Citation

Forster, A. , Chiche, A. , Chiang, M. , Stafford, C. and Karim, A. (2004), Mapping Polymeric Properties Using Combinatorial and High-Throughput Methods: Adhesion and Mechanical Properties, Society of Plastics Engineers, Annual Technical Conference| 62nd Volume II | ANTEC 2004: Annual Technical Conference Proceedings | Society of Plastics Engineers, Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852270 (Accessed December 26, 2024)