Miller, W.
and Tang, Y.
(2000),
Measurement Assurance Program for an Intercomparison of Josephson Voltage Standards between NIST and Lockheed Martin Astronautics, 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Toronto, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=22395
(Accessed January 8, 2025)
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Measurement Assurance Program for an Intercomparison of Josephson Voltage Standards between NIST and Lockheed Martin Astronautics
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Author(s)
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Abstract
An intercomparison of 10 V Josephson voltage standards (JVS) between NIST and Lockheed Martin Astronautics (LMA) using four travelling Zener standards will be presented. The main purpose of the intercomparison was to establish traceability of LMA's JVS to the U.S. National representation of the SI volt for the 1999 JVS Interlaboratory comparison organized by the National Conference of Standard Laboratories (NCSL). The secondary purpose was to test the technique of applying pressure corrections in order to improve the uncertainty of the comparison. A Measurement Assurance Map (MAP) protocol was adopted for the intercomparison. The MAP procedure, measurement methods, uncertainty analysis and intercomparison results will be discussed.Proceedings Title
2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 16-20, 2000
Conference Location
Toronto, 1, CA
Pub Type
Conferences
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Keywords
intercomparison, Josephson voltage standard, uncertainty
Citation
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Created June 30, 2000, Updated October 12, 2021