Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Published

November 18, 2021

Author(s)

Kyle McKay, Dustin Hite, Philip D. Kent, Shlomi S. Kotler, Dietrich Leibfried, Daniel Slichter, Andrew C. Wilson, David P. Pappas

Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

Citation

Physical Review A

Volume

104

Issue

5

Pub Type

Journals

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DOI Link

Keywords

Atomic Physics, Surface Science, Quantum Computing, Trapped-ion sensors, Surface characterization tools, Electric-field noise

Citation

McKay, K. , Hite, D. , Kent, P. , Kotler, S. , Leibfried, D. , Slichter, D. , Wilson, A. and Pappas, D. (2021), Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor, Physical Review A, [online], https://doi.org/10.1103/PhysRevA.104.052610 (Accessed November 21, 2024)