Rufenacht, A.
, Burroughs, C.
, Dresselhaus, P.
and Benz, S.
(2018),
Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standard, Conference on Precision Electromagnetic Measurements, Conference Digest, Denver, CO, [online], https://doi.org/10.1109/CPEM.2018.8500911
(Accessed December 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standard
Published
Author(s)
, , ,
Abstract
The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and the resulting multiple leakage paths, the quantities "leakage resistance" and "leakage current" are not necessarily equivalent. A method to measure and model the leakage current to ground for a given PJVS output voltage is presented. By upgrading simple components of the NIST system, the leakage current to ground can be reduced from 250 pA to 50 pA at 10 V.Proceedings Title
Conference on Precision Electromagnetic Measurements, Conference Digest
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO
Conference Title
CPEM 2020
Pub Type
Conferences
Download Paper
Keywords
Josephson-junction arrays, measurement techniques, precision measurements, standards, superconducting integrated circuits, voltage measurement, programmable Josephson voltage standards, PJVS, parallel biasing scheme, leakage resistance, leakage current
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 7, 2018, Updated July 10, 2020