Ramadurgakar, A.
, Remley, K.
, Williams, D.
, Rezac, J.
, Piket-May, M.
and Horansky, R.
(2023),
A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection, 2023 101st ARFTG Microwave Measurement Conference (ARFTG), San Diego, CA, US, [online], https://doi.org/10.1109/ARFTG57476.2023.10279175, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935930
(Accessed November 23, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection
Published
Author(s)
, , , , MELINDA PIKET-MAY,
Abstract
Standard formulations of error vector magnitude compare a wireless device's symbol constellation to an ideal reference constellation. In this work, we utilize the residual error vector magnitude, which uses measurements of a wireless device to define a reference constellation. We apply this formulation to the problem of identifying a device's manufacturer from over-the-air measurements of the wireless device and show that the residual error vector magnitude outperforms standard error vector magnitude formulation in this task.Proceedings Title
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
Conference Dates
June 11-16, 2023
Conference Location
San Diego, CA, US
Pub Type
Conferences
Download Paper
Keywords
Error Vector Magnitude(EVM), residual EVM, user equipment(UE), over-the-Air (OTA), wireless system, vector signal analyzer(VSA), long term evolution(LTE)
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 17, 2023, Updated December 22, 2023