Stoup, J.
and Faust, B.
(2010),
Measuring Step Gauges Using the NIST M48 CMM, Proceedings of NCSL Workshop and Symposium 2010, Providence, RI, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905761
(Accessed October 31, 2024)
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Measuring Step Gauges Using the NIST M48 CMM
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Abstract
The Moore M48 coordinate measuring machine (CMM) has provided NIST with unique and very flexible measurement capabilities for many years. The machines state of the art performance was further improved following the move of the machine into the new Advanced Measurement Laboratory (AML) on the Gaithersburg, Maryland site. These improvements are particularly evident in the measurement of 1D step gauges of lengths approaching a meter. This paper will describe the measurement process currently used for these long 1D artifacts. The development of the data collection algorithms, data analysis techniques, and process control methods will be discussed. The impact of thermal issues, elastic deformation resulting from probe contact, gauge fixturing, and coordinate system generation and the impact of these considerations on the measurement uncertainty budget will be presented in detail.Conference Dates
July 25-29, 2010
Conference Location
Providence, RI
Conference Title
Proceedings of NCSL Workshop and Symposium 2010
Pub Type
Conferences
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Keywords
coordinate measuring machine, CMM, step gauge, uncertainty, reproducibility
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Created July 25, 2010, Updated February 19, 2017