Jargon, J.
and Williams, D.
(2017),
A Method for Improving High-Insertion-Loss Measurements with a Vector Network Analyzer, 89th ARFTG Microwave Measurement Symposium, Honolulu, HI, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922897
(Accessed April 5, 2025)
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A Method for Improving High-Insertion-Loss Measurements with a Vector Network Analyzer
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Abstract
We present a method for improving high-insertion-loss measurements with a calibrated vector network analyzer (VNA) requiring only two additional pieces of hardware. By utilizing an amplifier and an attenuator, and measuring wave-parameters rather than scattering-parameters, we are able to increase the dynamic range of our measurements while decreasing uncertainties due to the noise floor of the VNA. We compare the results of our technique to standard methods for insertion-loss values up to 110 dB.Proceedings Title
89th ARFTG Microwave Measurement Symposium
Conference Dates
June 9, 2017
Conference Location
Honolulu, HI, US
Pub Type
Conferences
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Keywords
attenuator, calibration, high insertion loss, measurement, uncertainty, vector network analyzer
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Created June 8, 2017, Updated April 8, 2022