Fagan, J.
, Hight, A.
, Zheng, M.
, Jacques, L.
and Finnie, P.
(2019),
Metrological Assessment of Single-Walled Carbon Nanotube Materials by Optical Methods, World Scientific Publishing Company, Hackensack, NJ, [online], https://doi.org/10.1142/10862
(Accessed December 26, 2024)
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Metrological Assessment of Single-Walled Carbon Nanotube Materials by Optical Methods
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Author(s)
, , , Lefebvre Jacques, Paul Finnie
Abstract
This chapter discusses the metrology i.e. the science of measurement of single-wall carbon nanotubes (SWCNTs) with optical methods. Professor Mildred (Millie) Dresselhaus was a strong advocate for nanotube metrology and a pioneer in carbon nanotube optical physics. She wanted the advantages of these novel nanomaterials to be harnessed by industry and the world at large. Here we present a metrological perspective on SWCNT optics, covering only the most essential photophysics, discussing sample properties and conditions that affect optical characterization, and the current metrological application of the most important optical characterization methods. We give a perspective on the continued development of nanotube metrology. Standards meetings, technical specifications and other standard documents and protocols, as well as SWCNT reference materials are reviewed.Citation
Optical Properties of Carbon Nanotubes A Volume Dedicated to the Memory of Professor Mildred Dresselhaus.
Publisher Info
World Scientific Publishing Company, Hackensack, NJ
Pub Type
Books
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 1, 2019, Updated April 15, 2020