A Metrology Foundation for 3D Ballistic Imaging - NIJ Final Technical Report

Published

September 1, 2021

Author(s)

Michael Stocker, Johannes Soons, Thomas Renegar, Xiaoyu Zheng, Robert Thompson

Abstract

Forensic laboratories considering optical 3D surface topography measurement for objective comparison and VCM face challenges with respect to cost, training, and quality assurance. The primary aim of this research was to address quality assurance issues that currently represent barriers to entry for these methodologies. 3D optical surface topography microscopes are complicated instruments and evaluating and validating their performance is not trivial. Understanding microscope performance is important in the selection, validation, and monitoring of these instruments. The two key research components of this project are: 1) the development of prototype physical reference artifacts for key metrological characteristics of 3D surface topography microscopes, and 2) establishing guidance on how to implement a quality assurance system to monitor and ensure the quality of topography data acquired for FATM analysis. The elements of the research presented below work towards establishing a necessary metrology foundation for implementing 3D methodologies in forensic case work.

Citation

NCJRS Virtual Library

Pub Weblink

https://www.ojp.gov/ncjrs/virtual-library/abstracts/metrology-foundation-3d-bal…

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Keywords

3D ballistic imaging , firearm and toolmark analysis, metrological characteristics, quality control, reference materials, topography, virtual comparison microscopy

Citation

Stocker, M. , Soons, J. , Renegar, T. , Zheng, X. and Thompson, R. (2021), A Metrology Foundation for 3D Ballistic Imaging - NIJ Final Technical Report, NCJRS Virtual Library, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932914, https://www.ojp.gov/ncjrs/virtual-library/abstracts/metrology-foundation-3d-ballistic-imaging (Accessed October 31, 2024)