Microcalorimeter EDS: Benefits and Drawbacks

Published

August 1, 2000

Author(s)

David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis

Abstract

The commercial introduction of high-count-rate, near-room-temperature silicon drift detectors (presently available) and high-energy-resolution cryogenic microcalorimeters (forthcoming) is an exciting development in x-ray microanalysis, in which detector choices and capabilities have been essentially stable for many years. Both of these new energy-dispersive detectors promise improved capabilities for specific applications, e.g., faster EDS mapping (silicon drift detectors) and particle analysis (microcalorimeters). As practical experience is obtained using these detectors in diverse analytical situations, a more complete understanding is gained of the applicability of these new technologies. In this paper, we very briefly examine some of the important benefits and drawbacks of microcalorimeter EDS for x-ray microanalysis.

Proceedings Title

Proc., Microscopy and Microanalysis Conf.

Conference Dates

August 13-17, 2000

Conference Location

Philadelphia, PA, USA

Pub Type

Conferences

Keywords

EDS, energy dispersive spectrometer, microcalorimeter, microcalorimeter EDS, x-ray spectrometer

Citation

Wollman, D. , Newbury, D. , Nam, S. , Hilton, G. , Irwin, K. , Rudman, D. , Deiker, S. , Bergren, N. and Martinis, J. (2000), Microcalorimeter EDS: Benefits and Drawbacks, Proc., Microscopy and Microanalysis Conf., Philadelphia, PA, USA (Accessed October 31, 2024)